CIQTEK has validated its DB550 Focused Ion Beam Scanning Electron Microscope (FIB-SEM) on real 5nm process node chip samples, demonstrating production-ready TEM sample preparation with intact fin structures, zero amorphization, and clearly resolved film layers. The results confirm that the DB550 meets the exacting demands of advanced semiconductor failure analysis labs working at the cutting edge of process technology.

In advanced chip research and manufacturing, two tools matter above all others. The Transmission Electron Microscope (TEM) lets you see structures at the atomic scale. But before you can look, you need a sample thin enough for electrons to pass through. That is where the dual-beam FIB-SEM comes in. It is the precision workshop that prepares those ultra-thin specimens.