Contents
  1. 1. Why Precise Nanoscale Sampling MattersIn cutting-edge fields like materials science, life sciences, and semiconductor device research, precision sampling at the nanoscale is often a prerequisite for meaningful results. Whether it's extracting a specific failure site from a semiconductor die or isolating organelles from a single cell, conventional sampling methods often fall short, lacking the resolution, accuracy, and environmental control needed for high-sensitivity analysis.This is where advanced FIB-SEM (Focused Ion Beam Scanning Electron Microscopy) systems come in, especially those equipped with an integrated nanomanipulator. Among these, the CIQTEK Dual Beam SEM DB550 stands out for its high-resolution imaging, picometer-level manipulation accuracy, and seamless integration of sample preparation, lift-out, and analysis tools. How the CIQTEK DB550 Elevates Nanoscale Sample Handling1. High-Resolution SEM Imaging for Target Site IdentificationThe CIQTEK FIB-SEM DB550’s field emission electron column delivers exceptional imaging clarity, achieving up to 0.9 nm resolution at 15 kV, ideal for resolving intricate microstructures. This high-resolution SEM capability allows researchers to visually navigate complex surfaces and precisely locate regions of interest, be it nanoscale particles in a composite, organelles within cells, or structural defects in advanced nodes of semiconductor failure analysis. 2. Integrated Nanomanipulator for Picometer-Level PrecisionThe nanomanipulator integrated into DB550 offers 3D control with picometer-scale positioning accuracy, making it ideal for site-specific sample preparation. It enables researchers to approach, grip, and lift-out micro- and nano-sized features with remarkable control. For instance, the nanomanipulator can delicately extract a specific nanowire from a dense network or isolate a membrane region in biological samples, all while minimizing mechanical stress.This feature is particularly valuable for workflows like: TEM sample lift-out from semiconductor devices Nano-probing for electrical testing Sample isolation for single-cell omics  3. Maximizing Sample Integrity During TransferOne of the challenges in nanoscale sampling is preserving the original structure and chemistry of the specimen. The DB550 addresses this through: Dynamic force control, preventing deformation or breakage during manipulation Cleanroom-grade vacuum and anti-contamination protocols, protecting the sample from environmental exposure This ensures low-damage nano-extraction, which is critical for downstream EDS (Energy Dispersive X-ray Spectroscopy), EBSD, or TEM analysis. 4. Seamless Workflow with Dual Beam FunctionalityThe synergy of focused ion beam and electron beam in the DB550 allows for a complete sampling and analysis pipeline: FIB milling can preprocess the sample site and remove surface contaminants or cut trenches Nanomanipulator then lifts out the precise section In-situ SEM or EDS analysis can be immediately performed for real-time verification This one-stop nanoscale manipulation platform significantly enhances efficiency while maintaining data fidelity. Why CIQTEK DB550 is Ideal for Advanced NanomanipulationTechnology independence: CIQTEK’s proprietary core technologies offer performance on par with world-leading brands, at a more competitive price pointWorkflow integration: From focused ion beam milling to sample lift-out, the DB550 supports in-situ manipulation and imaging, reducing the need for external systemsUser-centric design: Fully localized software, intuitive navigation, and automation options enhance accessibility for new and experienced users alikeWhether you're preparing site-specific lamellae for TEM, isolating features from biological tissue, or performing complex nanomanipulation in electron microscopy, the DB550 offers a powerful and versatile solution. It’s not just a tool. It’s a nanoscale sampling ecosystem designed to keep your research on the cutting edge.Explore how the CIQTEK DB550 Dual Beam FIB-SEM can optimize your nanoengineering workflows: from precise lift-out to clean sample extraction and real-time analysis.
  2. 2. How the CIQTEK DB550 Elevates Nanoscale Sample Handling
    1. 2.1. 1. High-Resolution SEM Imaging for Target Site Identification
    2. 2.2. 2. Integrated Nanomanipulator for Picometer-Level Precision
    3. 2.3.  
    4. 2.4. 3. Maximizing Sample Integrity During Transfer
    5. 2.5. 4. Seamless Workflow with Dual Beam Functionality
  3. 3. Why CIQTEK DB550 is Ideal for Advanced Nanomanipulation

Why Precise Nanoscale Sampling Matters

In cutting-edge fields like materials science, life sciences, and semiconductor device research, precision sampling at the nanoscale is often a prerequisite for meaningful results. Whether it's extracting a specific failure site from a semiconductor die or isolating organelles from a single cell, conventional sampling methods often fall short, lacking the resolution, accuracy, and environmental control needed for high-sensitivity analysis.

This is where advanced FIB-SEM (Focused Ion Beam Scanning Electron Microscopy) systems come in, especially those equipped with an integrated nanomanipulator. Among these, the CIQTEK Dual Beam SEM DB550 stands out for its high-resolution imaging, picometer-level manipulation accuracy, and seamless integration of sample preparation, lift-out, and analysis tools.

 

How the CIQTEK DB550 Elevates Nanoscale Sample Handling

1. High-Resolution SEM Imaging for Target Site Identification

The CIQTEK FIB-SEM DB550’s field emission electron column delivers exceptional imaging clarity, achieving up to 0.9 nm resolution at 15 kV, ideal for resolving intricate microstructures. This high-resolution SEM capability allows researchers to visually navigate complex surfaces and precisely locate regions of interest, be it nanoscale particles in a composite, organelles within cells, or structural defects in advanced nodes of semiconductor failure analysis.

 

2. Integrated Nanomanipulator for Picometer-Level Precision

The nanomanipulator integrated into DB550 offers 3D control with picometer-scale positioning accuracy, making it ideal for site-specific sample preparation. It enables researchers to approach, grip, and lift-out micro- and nano-sized features with remarkable control. For instance, the nanomanipulator can delicately extract a specific nanowire from a dense network or isolate a membrane region in biological samples, all while minimizing mechanical stress.

This feature is particularly valuable for workflows like:

  • TEM sample lift-out from semiconductor devices
  • Nano-probing for electrical testing
  • Sample isolation for single-cell omics

 

3. Maximizing Sample Integrity During Transfer

One of the challenges in nanoscale sampling is preserving the original structure and chemistry of the specimen. The DB550 addresses this through:

  • Dynamic force control, preventing deformation or breakage during manipulation
  • Cleanroom-grade vacuum and anti-contamination protocols, protecting the sample from environmental exposure

This ensures low-damage nano-extraction, which is critical for downstream EDS (Energy Dispersive X-ray Spectroscopy), EBSD, or TEM analysis.

 

4. Seamless Workflow with Dual Beam Functionality

The synergy of focused ion beam and electron beam in the DB550 allows for a complete sampling and analysis pipeline:

  • FIB milling can preprocess the sample site and remove surface contaminants or cut trenches
  • Nanomanipulator then lifts out the precise section
  • In-situ SEM or EDS analysis can be immediately performed for real-time verification

This one-stop nanoscale manipulation platform significantly enhances efficiency while maintaining data fidelity.

 

Why CIQTEK DB550 is Ideal for Advanced Nanomanipulation

Technology independence: CIQTEK’s proprietary core technologies offer performance on par with world-leading brands, at a more competitive price point

Workflow integration: From focused ion beam milling to sample lift-out, the DB550 supports in-situ manipulation and imaging, reducing the need for external systems

User-centric design: Fully localized software, intuitive navigation, and automation options enhance accessibility for new and experienced users alike

CIQTEK FIB-SEM

Whether you're preparing site-specific lamellae for TEM, isolating features from biological tissue, or performing complex nanomanipulation in electron microscopy, the DB550 offers a powerful and versatile solution. It’s not just a tool. It’s a nanoscale sampling ecosystem designed to keep your research on the cutting edge.

Explore how the CIQTEK DB550 Dual Beam FIB-SEM can optimize your nanoengineering workflows: from precise lift-out to clean sample extraction and real-time analysis.

Contents
  1. 1. Why Precise Nanoscale Sampling MattersIn cutting-edge fields like materials science, life sciences, and semiconductor device research, precision sampling at the nanoscale is often a prerequisite for meaningful results. Whether it's extracting a specific failure site from a semiconductor die or isolating organelles from a single cell, conventional sampling methods often fall short, lacking the resolution, accuracy, and environmental control needed for high-sensitivity analysis.This is where advanced FIB-SEM (Focused Ion Beam Scanning Electron Microscopy) systems come in, especially those equipped with an integrated nanomanipulator. Among these, the CIQTEK Dual Beam SEM DB550 stands out for its high-resolution imaging, picometer-level manipulation accuracy, and seamless integration of sample preparation, lift-out, and analysis tools. How the CIQTEK DB550 Elevates Nanoscale Sample Handling1. High-Resolution SEM Imaging for Target Site IdentificationThe CIQTEK FIB-SEM DB550’s field emission electron column delivers exceptional imaging clarity, achieving up to 0.9 nm resolution at 15 kV, ideal for resolving intricate microstructures. This high-resolution SEM capability allows researchers to visually navigate complex surfaces and precisely locate regions of interest, be it nanoscale particles in a composite, organelles within cells, or structural defects in advanced nodes of semiconductor failure analysis. 2. Integrated Nanomanipulator for Picometer-Level PrecisionThe nanomanipulator integrated into DB550 offers 3D control with picometer-scale positioning accuracy, making it ideal for site-specific sample preparation. It enables researchers to approach, grip, and lift-out micro- and nano-sized features with remarkable control. For instance, the nanomanipulator can delicately extract a specific nanowire from a dense network or isolate a membrane region in biological samples, all while minimizing mechanical stress.This feature is particularly valuable for workflows like: TEM sample lift-out from semiconductor devices Nano-probing for electrical testing Sample isolation for single-cell omics  3. Maximizing Sample Integrity During TransferOne of the challenges in nanoscale sampling is preserving the original structure and chemistry of the specimen. The DB550 addresses this through: Dynamic force control, preventing deformation or breakage during manipulation Cleanroom-grade vacuum and anti-contamination protocols, protecting the sample from environmental exposure This ensures low-damage nano-extraction, which is critical for downstream EDS (Energy Dispersive X-ray Spectroscopy), EBSD, or TEM analysis. 4. Seamless Workflow with Dual Beam FunctionalityThe synergy of focused ion beam and electron beam in the DB550 allows for a complete sampling and analysis pipeline: FIB milling can preprocess the sample site and remove surface contaminants or cut trenches Nanomanipulator then lifts out the precise section In-situ SEM or EDS analysis can be immediately performed for real-time verification This one-stop nanoscale manipulation platform significantly enhances efficiency while maintaining data fidelity. Why CIQTEK DB550 is Ideal for Advanced NanomanipulationTechnology independence: CIQTEK’s proprietary core technologies offer performance on par with world-leading brands, at a more competitive price pointWorkflow integration: From focused ion beam milling to sample lift-out, the DB550 supports in-situ manipulation and imaging, reducing the need for external systemsUser-centric design: Fully localized software, intuitive navigation, and automation options enhance accessibility for new and experienced users alikeWhether you're preparing site-specific lamellae for TEM, isolating features from biological tissue, or performing complex nanomanipulation in electron microscopy, the DB550 offers a powerful and versatile solution. It’s not just a tool. It’s a nanoscale sampling ecosystem designed to keep your research on the cutting edge.Explore how the CIQTEK DB550 Dual Beam FIB-SEM can optimize your nanoengineering workflows: from precise lift-out to clean sample extraction and real-time analysis.
  2. 2. How the CIQTEK DB550 Elevates Nanoscale Sample Handling
    1. 2.1. 1. High-Resolution SEM Imaging for Target Site Identification
    2. 2.2. 2. Integrated Nanomanipulator for Picometer-Level Precision
    3. 2.3.  
    4. 2.4. 3. Maximizing Sample Integrity During Transfer
    5. 2.5. 4. Seamless Workflow with Dual Beam Functionality
  3. 3. Why CIQTEK DB550 is Ideal for Advanced Nanomanipulation